Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

AILA is an AI lab assistant developed by researchers at IIT Delhi and collaborators, capable of performing scientific ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

Delhi, on Tuesday, announced an Artificial Intelligence Lab Assistant (AILA) -- an AI agent that is capable of designing ...

We know that the process of viral uptake into cells begins with interactions between proteins hemagglutinin and neuraminidase ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

A KAIST research team has developed a technology to directly observe nanoscale water droplets in real time and calculate their contact angles based on their shape. Observing how liquids like water ...